Abstract
The surfaces of wire-like silicon crystals grown by self-organizationprocesses are characterized using electron microscopy of highresolution, scanning tunnelling microscopy, x-ray microprobeanalysis, secondary-ion mass spectroscopy, and Auger electron spectroscopy. The results obtained have shown that the upperlayer of each microcrystalis a nanoporous envelope. The composition of the envelope is ingeneral similar to the composition of the bulk part of the crystalbut with some differences: the density of the matter - due to theporous nature of the envelope - is much smaller, and the density ofmetal impurities is slightly increased on the external surface.More striking was the fact that the external surface of the envelopeis passive under exposure to oxygen. In Auger spectra of crystalsstored in open air for several years, only the LVV and KLL peaksthat are specific to the atomically clean silicon surface wereobserved.
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