Abstract
The process of solid state phase formation by thermal annealing of multilayered films consisting of two kinds of unit lamella, Pt/Mn/Sb and Mn/Sb, was investigated by means of X-ray diffraction and transmission electron microscopy. The magnetization loops of the films were measured at room temperature by using a vibrating-sample magnetometer. Films consisting of the two phases PtMnSb and MnSb were successively produced. the relative amount of the PtMnSb and MnSb phases was considerably affected by the average composition of the multilayered films and the annealing conditions. The initial stacking pattern had a significant effect on the preferred orientation of the MnSb phase: the c axis of MnSb was preferentially orientated normal to the film surface in some annealed samples. Although films with perpendicular magnetic anisotropy could not be obtained, the part of the samples in which the c axis preferred orientation of MnSb was developed exhibited the presence of a component of perpendicular magnetization.
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