Abstract
The Storing Matter technique is derived from SIMS (Secondary Ion Mass Spectrometry) and consists in decoupling the sputtering of the specimen from the subsequent analysis step. PVC samples were sputtered by an Ar + beam with different fluences, and the emitted particles were deposited on a dedicated Ag collector. In a second step, the matter deposited on the collector was analyzed by static SIMS. For each deposit, several analysis points were chosen across a diameter of the collector in order to show the changes in the mass spectra as the deposit coverage changes. It was shown that the Storing Matter technique is sensitive enough to observe some well-known consequences of increasing the primary ion fluence, namely an increasing contribution of aromatic fragments and a decrease in sputtering yield.
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