Abstract
Noble gas is a homogenous, defect free medium. This unique property allows us to drift, multiply and collect electrons in a gas practically without losses over short time scales. The device based on these principles—the gas-filled proportional counter—has served as an X-ray detector for more than 90 years. Different processes such as space charge effect, aging, etc. limit the performance of the detector. These problems are even more severe at the third generation synchrotron sources owing to their high brilliance. Delay line based detectors have been constructed at the ESRF. It turned out that in most cases the speed of this data acquisition system is the main limiting factor. Recently, a very promising solution has evolved which can re-adapt the gas-filled detector to the challenges of the third generation sources. This development is based on micro-pattern detector, especially the Gas Electron Multiplier (GEM). The GEM allows higher local count rates by several orders of magnitude.
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