Abstract
In this paper, the characteristics of the set time (t set ) correlated with the initial off-state resistance (R off ) were studied using a statistical method based on a Ti/ZrO 2 /Pt RRAM device. The data were collected by the width-adjusting pulse operation (WAPO) method. The Weibull distribution is used to analyze t set variation. Both the Weibull slope (β t ) and scale factor (t set6 3%) of t Set distributions increase logarithmically with R off . An analytical cell-based model was developed to explain the experimental statistics. Our result provides an inspiration on the switching uniformity and optimization of the tradeoff between the set speed-disturb dilemma.
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