Abstract
Properties of proportional chambers with spherical drift spaces have been investigated. An experiment of X-ray diffraction in crystals shows that an accuracy of 0.5 mm, at 20° inclination with respect to the axis of the chamber, can be obtained with 4 cm of drift length. Such chambers have many applications: X-ray diffraction patterns, pin-hole imaging, angular distributions of cascades of X-rays in nuclear physics, etc.
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