Abstract
This paper describes the characteristics of two newly introduced solid-state intraoral X-ray detectors that use complementary metal oxide semiconductor chips. One is designed for ultra-high resolution repetitive tasks where dose minimization is also paramount (e.g. endodontics); the other is designed as a lower cost alternative that is suitable for most diagnostic tasks in dentistry (e.g. detection of proximal dental caries), provides moderately high spatial resolution and maintains dose requirements similar to or less than those for the fastest available analog intraoral radiographic films.
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