Abstract
A triple-crystal diffractometer is used to study the single crystal diffraction patterns of Si (111), (220), (333) and good agreement with the dynamical theory of X-ray diffraction on perfect single crystals is found. This proves the possibility of using Si single crystals as in X-ray spectroscopy for a double-crystal spectrometer with a high resolving power as well as for studying very narrow diffraction patterns by means of a triple-crystal diffractometer.
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