Abstract
Publisher Summary This chapter focuses on the role of Selected Ion Flow Tube (SIFT) in examining ion-neutral reactions. The SIFT technique is a natural extension of the Flowing Afterglow (FA) technique. It builds on and extends the versatility of the FA for the study of ion-neutral reactions under truly thermal conditions. Under this technique, the ions enter a quadrupole mass filter that can be set to pass ions of a given mass-to-charge ratio. These mass selected ions are injected at low energy via a small aperture into a flow tube along which they are convected by a fast-flowing carrier gas at a pressure of typically 0.5 Torr. In the SIFT, the ions are created in a remote ion source and not in the carrier gas-reactant-gas mixture. Thus, crucially, the ion source gas is excluded from the carrier gas and therefore from the reaction zone. Reactions, therefore, between the primary ions and their source gas cannot occur. Various types of ion source have been used in SIFT experiments, the choice depending on the ion types required. The simplest to use are low-pressure sources because they do not offer excessive gas loading to the diffusion pump. They can be built directly into the SIFT chamber.
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