The sapphire tips of the active control devices of detail’s dimensions of produced with hollows and ridges, with the possibility of determining the lateral approximation of ridges

Abstract

The high speed rotation of ≥10 turn/s details with intermittent surfaces when machining on grinding machines and small time tabs detail past the tip with a duration of less than 1-5 ms necessitates synchronization of the measurements in the active control devices (ACD) depending on the current position of the ridge and it lateral approach. The implementation of optical methods to control the shape of details and high-precision measurement of movements are also in demand in the ACD. The use of sapphire tips allows to solve three problems simultaneously: to create an asymmetric lateral optical flow to determine the lateral approach of the ridge of the detail, to use the tip as a reflector to measure the movements of the 1x, and to form a cut-off border to control the shape of the product.The article presents two optical ACD schemes implementing these capabilities with amplitude conversion of the optical signal and phase synchronization of the output signal frequency with the rotation of the detail. The conditions for ensuring a small roughness of the surface of the sapphire tip Rz under active control of the detail dimensions and the peculiarities of the formation of refractive and reflected optical flows with the help of it are considered. It is shown that the small roughness of the surface of the sapphire tip Rz≤0,1 μm, ensuring the coherence of the reflected optical flux, is achievable under the condition of a small effort of its clamping to the product ≤3H, which is similar to the processing of sapphire in quasi-plasticity to obtain a faultless surface. The article discusses the optical-mechanical, dynamic and metrological characteristics of the ACD using a laser interferometer movements.