Abstract
In this work we investigate some of the key factors in simultaneously recorded scanningtunneling microscopy (STM) and non-contact atomic force microscopy (nc-AFM) images of theTiO2(110) surface, particularly the role of tip size and orientation in the obtained contrast pattern,and the importance of tip–surface relaxations and surface impurities in measured currents.We show that, while using multi-channel scanning modes provides an increase inphysical data from a given measurement and greatly aids in interpretation, it alsodemands much greater rigor in simulations to provide a complete comparison.
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