Abstract

AbstractRidge‐furrow with plastic film mulching (RFPFM) is widely used as a water‐saving strategy for the improvement of crop yield. However, lodging susceptibility under RFPFM practices has not yet been determined. A 2‐yr field study comprising of three cultivation strategies (rain‐fed flat planting [FP], RFPFM, and well‐water planting [WW]) and two N application rates (75 and 225 kg N ha–1) was conducted to assess the risk of lodging and the relationship between lodging resistance and grain yields of two wheat (Triticum aestivum L.) varieties (Xinong979 as lodging resistant and Xiaoyan22 as lodging susceptible). The results showed that higher N application increased lodging index under FP and RFPFM, and the lodging index was 33% lower under RFPFM than under WW. In both years, there was a positive relationship between grain yield and lodging susceptibility (R2 = 0.62** and 0.57**) implying that promoting crop yield by using RFPFM strategy accelerates the risk of lodging. When compared with WW, RFPFM significantly reduced the lodging index, while sustaining a comparable grain yield. Overall, RFPFM could be highly recommended as a promising strategy for winter wheat producers in dry, semi‐humid regions. The close relationships of breaking resistance and lodging index with both mass density and stem wall thickness of basal internode suggest that selection for increased stem strength trait could lead to improved lodging resistance and higher yields in future programs for winter wheat cultivar improvement.

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