Abstract
The results of high resolution photoluminescence studies of erbium-implanted Czochralski-grown (CZ) and float-zone (FZ) silicon are presented. We show that the photoluminescence (PL) spectrum of cubic Er centers observed in CZ Si annealed at 900 °C is the dominant emission in FZ Si for the same annealing conditions. We assign it to an isolated interstitial erbium site and not to an octahedrally coordinated ErO complex. We resolve the PL lines of two ErO related centers with lower site symmetry (not found in FZ Si). The internal PL efficiency of the ErO defects is probably higher than that of isolated centers; however, the overall PL yield is rather controlled by the rate of energy transfer from excitons recombining at Er sites.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
