Abstract
Light output degradation of liquid-phase epitaxy (LPE) and vapor-phase epitaxy (VPE) GaP:N light emitting diodes (LED's) was studied by measuring electroluminescence efficiency, minority-carrier lifetimes, and effective nitrogen concentration during the degradation process. In LPE diodes the degradation is related to a decrease in minority-carrier lifetime, whereas in VPE diodes additionally a decrease in the effective nitrogen concentration was observed. This different degradation behavior is explained within a thermodynamic model which analyses the formation process of nitrogen atoms at substitutional and interstitial lattice sites under the different growth conditions of LPE and VPE.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
