Abstract
Experimentally recorded Auger lineshapes suggest that Auger Electron Spectroscopy (AES) can probe a local or a Mulliken like electron distribution, depending on the material examined. The Mulliken electron distribution is especially observed in compound materials. This distribution can be regarded as an approximation of inter-atomic Auger transitions. For a clean silicon surface on the other hand, a local electron distribution suffices to explain the measured Si LVV lineshape. Inter-atomic transitions are in this case not neglected, but incorporated by taking all the different atoms in the surface area, which are of the same element, into account in the calculation.
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