Abstract
The rotating-anode X-ray generator has played a very important role in the instrumentation of X-ray diffraction (XRD), which is a necessary tool in materials science. Such a rotating-anode X-ray generator was developed in 1952 in response to the demands of the community of powder diffraction crystallographers in Japan, whose long history extends to 1912. The rotating-anode generator has been improved with the advance of new technologies and over time has become more reliable and more powerful. This will be true also for the future. At present, an efficient parallel X-ray beam is obtained by combining the rotating-anode X-ray generator with newly developed X-ray optics based on a synthetic multilayer optic. Several applications to the characterization of advanced materials and thin film by XRD are presented. The significance of the use of imaging plate systems, two-dimensional digital detectors, in the X-ray characterization of materials is also given.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
