Abstract

SynopsisContaminations on two dimensional materials can influence electronic, optical or mechanical material properties or even dominate them. We perform ion beam spectroscopy with highly charged ions as projectiles transmitted through freestanding 2D materials to study fundamental charge exchange processes between the ion and the samples under extreme conditions. Various in situ cleaning techniques to remove contaminations such as laser annealing and sample heating are employed. Their influence on our spectroscopy results is discussed here.

Highlights

  • They introduced a promising candidate which is consistent with experimental data: the interatomic Coulombic decay (ICD) which is depicted in figure 1.3 (e) and (f)

  • It is notable that ions transmitted through support material have lower exit charge states than ions transmitted through a single layer of graphene, which is in agreement with a thicker sample and a longer interaction time for the ion to capture and stabilise electrons

  • Laser cleaning has the advantage of not increasing the target chamber pressure which makes it easier to continue cleaning while recording spectra

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Summary

Highly charged ions

Known phenomena occurring in ion-solid interaction such as nano structuring [10], sputtering ion. Wilhelm et al ruled out all of those processes because of considerations regarding time scales: measured neutralisation time constants of highly charged ions cannot be explained by such low rates that are associated with the mechanisms above [19, 28] They introduced a promising candidate which is consistent with experimental data: the interatomic Coulombic decay (ICD) which is depicted in figure 1.3 (e) and (f). Sary electron-electron interaction of projectile and target electrons can albeit be assumed which makes ICD applicable to HCIs. With the interatomic Coulombic decay being a fast process it is a possible solution to the time scale problem mentioned above and a good candidate for the description of the neutralisation process of a highly charged ion. Other mentioned cleaning techniques are for instance chemical cleaning (chloroform) or mechanical cleaning (scanning the surface with an AFM tip) [56]

Motivation
Experimental methods
Electron beam ion source
Ion beam spectrometer
Beam energy distribution
Discussion and results
Heat treatment
Findings
Laser treatment
Conclusion and outlook
Full Text
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