Abstract
The bulk form of Se78In(22-x)Bix (x = 0, 4, 8, and 12 at.%) was produced with melt-quench technology. Subsequently, thin films of these compositions were produced through the thermal evaporation method under vacuum conditions. Analysis via diffraction of X-rays confirmed the disordered character of the resulting films. The refractive index (n) and extinction coefficient (k) were computed using optical transmission T(λ) and reflection R(λ) data. Analysis of optical constants revealed that the optical energy gap Egopt decreases while the Urbach tail Eu augments as the Bi content increases. Other related constants were determined and investigated in relation to variations in Bi content. The outcomes of our study were compared with those published previously. Non-linear parameters were calculated and discussed for the investigated films.
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