The role of σ5 coincidence boundaries in the growth selection of Fe—3% Si

Abstract

Texture data, obtained by X-ray diffraction, is used to determine the CSL (σ) statistics relating grain orientations in primary recrystallized and secondary recrystallized conventional 3ain oriented (CGO) 3% silicon steel. The CSL (σ) statistics indicate that σ5, σ13a, and σ17a coincidence boundaries appear in significant quantities. Using the information gathered from the CSL (σ) statistics, the σ5 operator is chosen to perform orientation transformations calculating primary and secondary recrystallization textures, good agreement being found between the experimental and the calculated textures. It appears that the amount of available σ5 coincidence boundaries, relating the grains in the primary recrystallized and those in the secondary recrystallized material, influences the sharpness of the final Goss texture. It is found also that using the σ5 operator the main features of the ‘desirable primary recrystallization texture’ that give a sharp Goss texture can be determined.