Abstract

Conversion electron Mössbauer spectroscopy (CEMS), Rutherford backscattering spectroscopy (RBS), and transmission electron microscopy (TEM) have been used to determine the structure and resulting charge state of tin implanted into sapphire at room temperature. Both RBS and TEM indicated the surface to be amorphous for fluences of 4 × 10 16 119Sn/cm 2 (180 keV) and higher. The contrast in the TEM examinations suggests that at least two “amorphous phases” exist. The CEMS measurements indicate the tin to be distributed between the states Sn(II) and Sn(IV).

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