The relationship between the secondary implant stability quotient and oxidized implant-related factors: A retrospective study

Abstract

ObjectiveThe present retrospective study aimed to determine the relationship between the secondary implant stability quotient and different parameters related to an oxidized implant. MethodsA total of 135 patients (305 oxidized implants) were included. Implant-related factors (length, diameter, surgical and loading protocols, grafting, insertion torque, and primary stability) were used for comparisons and linear regression analyses, using secondary ISQ as the dependent variable. ResultsAt the patient level, the mean time from implantation to secondary ISQ registration was 20.3 ± 29 weeks, and the mean secondary ISQ was 77.30 ± 7.22. The ISQ did not reveal significant differences regarding implant lengths, loading protocol, and simultaneous grafting. In contrast, platform diameters (3.5, 4.3, and 5.0), surgical protocols (one stage versus two stages), insertion torque (<35 Ncm versus >35 Ncm), and primary stability (achieved versus not achieved) all revealed significant secondary ISQ differences. Nevertheless, the regression analysis demonstrated that the platform diameter was the only variable significantly and positively predicted the secondary ISQ. Similar findings were found with the implant level analysis. ConclusionsAmong different implant- and protocol-related parameters, the platform diameter of the oxidized implant appears to be the only significant predictor of high secondary ISQ values at the time of superstructure connection.