Abstract
Variation in the switching parameters, threshold voltage and delay time, has been observed for devices based on bulk chalcogenide glass. Experimental analysis revealed that the variation has two main components: (1) slow semi-reversible ageing taking place throughout the life of the device, (2) fast fluctuations occurring from operation to operation. It was further shown that the latter variation is not random but that correlation exists between sequential switching operations. A semi-quantitative theoretical model is presented to explain the observed phenomena in terms of microstructural changes in the glass during switching.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
