Abstract

It is well known that the amount of solute segregation can vary from one grain boundary to another. Though it is accepted that this variation is due to differences in boundary structure and crystallography, direct correlation between the degree of segregation and specific boundary structural characteristics is not well documented. In the present paper, P grain-boundary segregation in rapidly solidified Fe was studied by X-ray mapping (XRM) in a scanning transmission electron microscope (STEM). The boundary structure was characterized by convergent beam electron diffraction (CBED). To explore the relationship between the degree of segregation and boundary structure, a parameter β is introduced, which describes how well the two crystal planes on either side of a grain boundary match each other in a manner similar to the long-established plane matching theory. The introduction of this parameter enables us to relate the degree of segregation to boundary structure in a consistent way, e.g., both small-angle and low Σ symmetric boundaries correspond to low angle of β, leads to a low degree of segregation.

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