Abstract
AbstractA study has been made of the growth of copper films obtained by the reduction with dry H2 of copper (I) oxide and mixed Cu(I), Cu(II) oxide layers formed on copper (100), (110), and (111) faces and on polycrystalline copper. It has been observed that while the orientations present in the copper(I) oxide layers were carried over to the metal films formed on reduction, Cu(II) oxide films, orientated or otherwise, always yielded polycrystalline copper.The different behaviours of the two oxides are related to the different configurations of copper ions in the crystal lattices of the two oxides and to the low mobility of copper atoms at the temperature of reduction (≈ 300°C).
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Zeitschrift für anorganische und allgemeine Chemie
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
