The Reconfigurable Structure Design of Built in Self Test Technology

Abstract

Modern digital circuits has caused the test difficult and the high cost of system maintenance due to its large-scale, high complexity. Built in Self Test (BIST) is an effective design for testability technology for this problem. Because of the interior design of the test generation and analysis modules, BIST requires additional hardware resources consumption. The reconfigurable logic block observer based on multiplexing structure is proposed and a reconfigurable BIST structure based on this block analysis by the test generation and the structure analysis of characteristics analysis module is designed in this paper. Simulation results show that the consumption of hardware resources is deduced effectively by structure time-division multiplexing, the test logic is correct and effective and it shortens the test time.