Abstract
Plasma dissociated zircon, which consists of finely divided spherulitic crystals of monoclinic ZrO2 in SiO2 glass, reassociates very slowly at 1500° C unless finely ground. It is suggested that this effect is due to surface nucleation control of the reaction rate. Plasma dissociated zircon in the form of a rapidly quenched coating consists entirely of tetragonal ZrO2 crystals less than 20 nm diameter dispersed in glass. Reassociation occurs rapidly between 1300 and 1450° C because of the surface nucleation effect and enhanced zircon crystal growth rate arising from the very small diffusion distance ahead of the interface of a growing zircon crystal.
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