Abstract
AbstractThe critical behaviour of the random field Ising model is calculated in d = 2 + ϵ dimensions, using previous findings on interface roughening of Grinstein and Ma. The critical exponents are expressed in terms of ϵ and the dimension β/v of the order parameter field. ϵ and β/v are assumed to be small. For nonvanishing random field strength HR the critical behaviour is governed by a zero temperature fixed point HRc ˜ (ϵ + 2β/v)3/4. In particular μ = 3/4 and v−1 = ⅔ (ϵ + 2β/v) are obtained for the interface tension and the correlation length exponent, respectively. The relation between interface and bulk correlation lengths in the various regions is discussed.
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