Abstract
This work presents a solution for radiation hardness assessment using compact and productive X-ray facilities, as well as the automated measurement system. The radiation test procedure can be integrated in commercial IC's process as a mandatory option for providing high reliability and radiation hardened IC projects.Using the radiation test procedure as a one of technology stage, the assessment of total ionizing dose (TID) hardness was done for test structures, which were fabricated in conventional 65nm CMOS technology.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
