Abstract
The electrostriction tensor components gamma ij of CaF2, SrF2 and BaF2 have been measured by means of the stabilised optical Michelson laser interferometer method. The sign and amplitude of the components are compared with results obtained by the capacitive displacement method and the indirect method of measuring the pressure dependence of the dielectric constant. It is found that the sign of the gamma ij is consistent with that measured by the capacitive method and that their magnitudes agree with the results of the indirect method.
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