Abstract
The propagation of long-duration single-event transient (SET) tails in radio frequency (RF) amplifiers implemented with SOI CMOS was investigated using laser pulses to emulate heavy ion strikes. Transients were recorded and analyzed in CMOS transistors, a <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">K<sub>u</sub></i> -band amplifier, and a broadband amplifier. At the device-level, transient modifications to small-signal transconductance were confirmed in TCAD, but these changes were found to be insignificant for practical transistor sizings found in RF amplifiers. In RF amplifiers, filtering due to matching networks and regulation from negative feedback were found to reduce potential system-level sensitivities to these transient tails. Body-contacting was shown to reduce transient amplitude, at the cost of amplifier performance, but its application in eliminating the transient tail is likely only worthwhile in DC-coupled amplifiers. Selection of pMOS over nMOS transistors was also confirmed to reduce transient amplitude, but with no benefit to transient duration. The present work demonstrates that body-contacting can reduce transient amplitude at the cost of RF performance, but no benefit in transient duration is expected at the amplifier-level for many cases.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.