Abstract
(ZrO2)1–x(Yb2O3)x binary systems were investigated in the doping range of 0.02 ≤ x ≤ 0.12. Ytterbium‐doped zirconia powders were synthesized using the Pechini method. X‐ray diffraction (XRD) measurements showed that fcc ZrO2 was stabilized for 8–12 mol% Yb‐doping rate. The produced Yb‐stabilized Zr (YbSZ) films were characterized; their thickness and homogeneity properties depended on the nature of the YbSZ slurry. All coating parameters were optimized and determined with precoating treatments. The samples were characterized by differential thermal analysis/thermal gravimetry (DTA/TG), scanning electron microscopy (SEM) and ac impedance measurements.
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