The principles and interpretation of annular dark-field Z-contrast imaging

Abstract

Publisher Summary This chapter describes the way in which an annular dark-field (ADF) image is formed in a scanning transmission electron microscope (STEM). ADF imaging refers to the use of particular detector geometry in STEM. A geometrically large annular detector is placed in the optical far field beyond the specimen. The total intensity detected over the whole detector is recorded and displayed as a function of the position of the illuminating probe. Because the detector only receives a signal when the specimen is present, the vacuum appears dark, hence the name, and the heavier the atom, the higher the intensity of the scattering, which leads to atomic number (Z) contrast in the image. The most important feature of ADF imaging is that it can be described as being incoherent that has many advantages at atomic resolution. The chapter explains the way in which the image data may be used to provide atomic-resolution information about the specimen.