Abstract
A new method for the preparation of thin foils of metal surfaces for transmission electron microscopy has been developed. This method involves a multistage mounting and polishing technique which results in surface foil preservation to within a fraction of a micron from the metal-free surface. It is shown that the technique results in large amounts of deformation-free transparent foil area. It may be used for the foil preparation of any metal surface and is especially useful in studying the microstructural characteristics and dislocation substructures of such phenomena as surface deformation, fatigue deformation, and fracture surfaces.
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