Abstract
The La0.5Sr0.5MnO3 (SLM)-8 mol % yttria stabilized cubic zirconia (YSZ) composite films were deposited on YSZ and α-alumina tablets by a sputtering technique. The films with various SLM/YSZ ratios were deposited by applying electric power to SLM and YSZ targets independently. The electrical conductivity and oxygen reduction over potential of the films were measured. The electrical conductivity of the sputtered films was adequate for cathode inplanar SOFC. The cathodic over potential extremely decreased with the addition of YSZ to SLM.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
