Abstract
The X-ray diffraction patterns and pole figures of the La 0.67Sr 0.33MnO 3− δ films, which were fabricated on (110) LaAlO 3 single-crystal substrates using the direct current magnetron sputtering technique were studied systematically. It is concluded that all films are high-quality epitaxial films and there is a perfect matching relationship between the films and the substrates. The effect of the different orientations ((110) and (100)) on the resistivity and metal–insulator transition temperature is briefly discussed.
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