Abstract
The technical arrangement and the fundamental principles of a plasma emission detector (PED) are presented. Based on oscillating interference filters, the PED is able to identify different spectral positions, which allow the measurement of emission line intensities together with the accompanying background. To demonstrate the range of possible applications, coupling of the PED with two plasma sources (MIP and CMP) and the analytical principles [adsorbable organohalogen compounds (AOX) and Hg speciation] are described. Furthermore, the analytical performance is demonstrated by statistical treatment of multi-element calibrations and by the determination of methylmercury (MeHg) in CRMs 463 and 464 from the European Commission’s Standard, Measurement and Testing Programme.
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