Abstract

The adsorption of SnCl 4 and SnBr 4 on polycrystalline SnO 2 has been studied using synchrotron radiation based far-infrared reflection absorption infrared spectroscopy FIR-RAIRS. In order to exploit the sensitivity advantages of the buried metal layer method, the SnO 2 is in the form of a thin film deposited on a tungsten foil substrate. Adsorption of SnCl 4 and SnBr 4 on an oxygen sputtered surface at 120 K results in spectra characteristic of condensed multilayers. In addition, both spectra exhibit an inverse absorption band centred at 355 cm −1. Modified 4-layer, wavelength-dependent, Greenler calculations show that this inverse absorption band is induced by the presence of the adsorbate but is characteristic of the SnO 2 layer. The lack of any frequency shift upon changing the adsorbate from SnCl 4 to SnBr 4 rules out the possibility that the inverse absorption band is due to a dipole-forbidden parallel mode of the molecule excited via the interaction with free electron oscillations in the metal, resulting from the radiation induced oscillating electric field just below the surface.

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