The Optimization of Step Size While Collecting a Digitized Diffraction Pattern at a Constant Total Scan Time

Abstract

Given a limited amount of time for data collection, what parameters do you select to generate the highest quality x-ray diffraction pattern from an automated diffractometer? This paper addresses the major topic of diffractometer step size or its equivalent, chopper size, for instruments running in the continuous scanning mode. In general, step size and chopper size will be interchanged freely. A minor topic intertwined into the discussion will be the receiver slit width.