The Optimal Control Method of Test Power Supply for DC Distribution Network

Abstract

Background:: The test power supply is one of the key devices in the DC distribution network, which is necessary to supply power with high quality for testing other devices' performance. The double active bridge (DAB) converter is a common circuit topology for test power supply, which has the advantages of high-frequency electrical isolation, bi-directional power flow, and high power density. For the converter, control methods, such as single-phase-shift (SPS) control, and single-current stress or single-return power optimization under extended-phase-shift (EPS) control, have their limitations, which influences efficiency. Objective:: This paper aims to propose a dual-objective optimal control method, which can effectively improve efficiency of the test power supply. Methods:: This paper addresses the limitations of SPS control, and single-current stress or singlereturn power optimization under EPS control of the DAB converter, and proposes a dual-objective optimal control method based on the idea of using objective planning in the full power range under the condition of satisfying soft switching, which effectively improves efficiency of the test power supply. Results:: With the proposed dual-objective optimal control method, the converter achieves a smaller current stress similar to that with the single-current stress optimal control, and the return power is also reduced by 29.51%. Efficiency of the test power supply reaches 86.9%, which is better than 82.5% with SPS control and 85.3% with single-current stress optimization under EPS control. The experimental results fully verify the effectiveness of the proposed control method. Conclusion:: A dual-objective optimal control method is proposed. By using the presented method, current stress and return power are both optimally designed, so the efficiency of the test power supply can be effectively improved. conclusion: A dual-objective optimal control method is proposed. By using the presented method, the efficiency of the test power supply can be effectively improved. other: none