Abstract
AbstractThe photosensitivity and electro-reflection spectra of CdS/CdTe heterojunctions annealed up to one hour in presence of CdC12 have been studied. The lifetime of charge carriers, generated in the interface layer, has been determined.The SnO2/CdS/CdTe/Ni thin films solar cells, deposited by close-spaced sublimation (CSS) technique are photosensitive in the 1.5-2.4 eV spectral region. The spectral distribution of photocurrent is not essentially modified by the increase of the annealing time. A slight decrease of the photocurrent in the 1.5-1.7 eV energy range is observed and the photocurrent slightly increases in the 1.7-2.4 eV region. The recombination of the nonequilibrium charge carriers in the interface layer takes place via recombination levels having a lifetime value, which decreases from 46 μs down to 30 μs along with photon energy increase from 1.55 eV to 2.4 eV respectively (T=293K). The correlation between the light penetration depth in component layers, estimated from the absorption spectral distribution and the photon energies was established.
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