Abstract
A procedure to make optical quality thin films of ZnxCd(1-x) Te by use of thermal evaporation of the ternary compound has been investigated. Structural and optical properties of ZnxCd(1-x)Te solid solution with x = 0.1 to 0.5 were synthesized, from the resulting ZnTe and CdTe composition used in preparation of thin films. Structural investigation indicates they have polycrystalline structure. Composition was confirmed from EDAX while SEM picture shows homogeneity in films. Plots of (αhν)2 versus (hν) yield straight line indicating direct transition occurs with optical band gap energies in the range 1.7 - 2.3 eV. It is also found with increase Zn content the band gap of the films increases. Refractive indices and extinction coefficients have been evaluated in the spectral range (200 - 2500 nm).
Highlights
Solid solution formation in semiconductors has been of interest for a number of years
An important question regarding ternary zinc-blende compound semiconductors is concerned with the structural and dynamic changes that can occur upon replacement of either cations or anions in the binary base material The II-VI compounds semiconductors and solid solutions based on them are promising source for various types of thin film devices such as thin film transistors [1], Solar cells [2] and photoconductors [3]
Thin films of ZnxCd(1-x)Te were prepared by variety of techniques, such as, two source vacuum evaporation [6], molecular beam epitaxy [7], chemical vapour deposition and closed space vapour transport [8,9], physical vapour transport (PVT) [10], vertical Bridgman growth [11]
Summary
Solid solution formation in semiconductors has been of interest for a number of years. Thin films of ZnxCd(1-x)Te were prepared by variety of techniques, such as, two source vacuum evaporation [6], molecular beam epitaxy [7], chemical vapour deposition and closed space vapour transport [8,9], physical vapour transport (PVT) [10], vertical Bridgman growth [11]. In the recent study ZnxCd(1-x)Te thin films are deposited by thermal evaporation at substrate temperature (373 K) and the films are annealed and characterized by energy dispersive X-ray analysis (EDAX) and scanning electron microscopy (SEM) technique for composition and surface morphology of the films. Optical properties of the films were studied by optical transmittance and reflectance measurement
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Surface Engineered Materials and Advanced Technology
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
