Abstract
The paper presents the impact of lighting type and direction on measurements of surface asperities using focus-variation microscopy. Particular attention was paid to the direction of lighting when using a light ring. It was pointed out that the lighting direction directly affects the values of the parameters Rt, Rz, and Rc. The article also presents the impact of a light polarizer on the surface topography parameters. It has been shown that the positioning of a sample with a regular and directed structure relative to the optical axis of the light polarizer affects the accuracy of mapping surface asperities. The largest differences were observed for Rz and Rt parameters. A method of using an external polarizer mounted on a focus variation microscope lens was also presented. Keywords: surface topography,
Highlights
The manufacturing process’s design is related to the understanding of structural requirements for the surface of materials in order to provide determined properties and performance parameters
It was found that the direction of the incident light on the tested surface in the optical profilometry affects the obtained surface profilometers
The most favorable conditions for measurement are with lighting coming from the lens or parallel lighting from the light ring
Summary
The manufacturing process’s design is related to the understanding of structural requirements for the surface of materials in order to provide determined properties and performance parameters. The choice of a control method and a measuring device for the materials’ surface analysis is important. It is important to ensure the reliability of surface mapping, along with the performance parameters such as resolution and measuring extent, and the time of measurement, which in turn translates into the cost and utility of a device. The most current devices for measuring the spatial topography of a surface are contact profilometers. Their usage is related to long data acquisition time (in the case of stereometry). The contact profilometer’s flaw is the need for the tested element to make contact with the measuring sample and the possibility of scratching it during the measurement (Dobrzanski and Pawlus, 2005; Wieczorowski, 2013)
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