Abstract
ABSTRACTSurface oxides present on polycrystalline MgB2 were characterized by high-resolution x-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES). X-ray diffraction (XRD) measurements were used to determine the MgB2 phases. XRD line broadening analysis reveals a grain size of 40 nm. XPS results show that MgO and B2O3 are the major surface oxides. Auger spectra provide further evidence of the presence of MgO. The B 1s and Mg 2p peaks have been used to quantify the amount of the surface oxides.
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