Abstract

AbstractDefect structures in (SN)x crystals obtained by solid‐state polymerization are so numerous and varied that they are likely to conceal inherent property aspects of the defect‐free polymer. In addition to frequent macroscopic twinning, three different kinds of defect sites are observed. These sites are related to the disruption of molecular orientational order about the chain axis direction and the sequencing of chain types in the periodic phase. The origin of these defects is explained by the nonuniqueness of solid‐state polymerization and recrystallization processes, which transform the initial dimer phase to the final polymer phase. The orientational relationship between the dimer and polymer phase is predicted from the observed twinning mode and the structural relationship between these phases. The change from dimer phase (at zero and at intermediate conversions involving solid solution formation) to polymer phase can be described by a shear transformation on the (001) dimer plane. This observation suggests an analogy with known martensitic reactions and a method for improving the perfection of (SN)x.

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