Abstract

The ID01 beamline has been built to combine Bragg diffraction with imaging techniques to produce a strain and mosaicity microscope for materials in their native or operando state. A scanning probe with nano-focused beams, objective-lens-based full-field microscopy and coherent diffraction imaging provide a suite of tools which deliver micrometre to few nanometre spatial resolution combined with 10-5 strain and 10-3 tilt sensitivity. A detailed description of the beamline from source to sample is provided and serves as a reference for the user community. The anticipated impact of the impending upgrade to the ESRF - Extremely Brilliant Source is also discussed.

Highlights

  • Since the discovery of their electromagnetic wave nature, the potential of the small wavelength of X-rays for microscopy has intrigued scientists

  • The beamline ID01 at ESRF – The European Synchrotron has been conceived in order to exploit and combine the lattice parameter resolution supplied by X-ray diffraction with the resolution available in direct space by current imaging techniques using the most advanced X-ray optics technology

  • The diffraction imaging techniques developed at this instrument can be divided into scanning techniques, full-field techniques and coherent reconstruction techniques

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Summary

Introduction

Since the discovery of their electromagnetic wave nature, the potential of the small wavelength of X-rays for microscopy has intrigued scientists. The high frequencies of X-rays being far above most resonant energies of bound electrons in matter makes refraction a very weak phenomenon. This imposes a severe absorption limit to the physically possible aperture of refractive lenses for X-rays. To supply a competitive tool for all these techniques the design of the beamline was optimized for beam stability on the one side and flexibility of the energy range and focusing mode on the other side This requires different operation modes that begin with a minimum of optical elements and allow for a set of optional beam-tuning devices that cover a wide range of available X-ray energies, beam sizes and fluxes. The source and primary optics setup is presented followed by a detailed description of the endstation together with some benchmark values and examples

Beamline overview
The X-ray source
Primary optics and monochromators
Secondary optical elements
Nanofocus endstation
Beam-focusing modes
Available techniques
Findings
Concluding remarks
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