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Abstract
A method is presented for the analysis of waveguide structures with abrupt index changes in both the transverse and axial directions. The method accurately includes the reflected fields and the Goos-Hanchen shift. The method can be extended to three-dimensional and graded index structures, and to include diffraction effects. For a graded index structure with no abrupt index changes the method reduces to the standard beam propagation method.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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