Abstract

This work considers the optical properties and structure of thin films of titanium dioxide formed by glancing angle deposition to improve the light yield of scintillation materials. The experimentally obtained value of the refractive index was about 1.2, which is almost two times less than the refractive index of crystalline titanium dioxide. This allows you to use this method to modify the optical properties of the surfaces of scintillators with a large refractive index.

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