Abstract
A description is given of a power device structure, the minority carrier injection controlled field-effect transistor (MICFET), in which a floating p region coupled to the drain via a MOSFET is used to inject minority carriers (holes) into the JFET and upper drift region of the DMOSFET to modulate the conductivity of the device during the on-state. The results of device modeling, two-dimensional numerical simulation, and measurements performed on 500-V devices indicate a 30% improvement in on-state current density over the DMOSFET with comparable turn-off times.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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