The microwave measurement of the dielectric properties by the parallel plate resonator and ceramic cavity method

Abstract

We have studied the measurement of low dielectric loss materials using a parallel plate resonator and ceramic cavity method. The measurement error of dielectric constant was 0.03%, due to reasons such as the difference diameter of the loop and the air gap effect. Reliable Q/spl times/f values were determined with a probe size of less than 2 mm and an insertion loss of more than 25 dB. Surface roughness could be reduced to less than 0.05 /spl mu/m. Measurement accuracy of the temperature coefficient of resonance frequency was improved to within /spl plusmn/0.2 by using the ceramic cavity.