Abstract
The application of thin underdense hydrogenated amorphous silicon (a‐Si:H) films for passivation of crystalline Si (c‐Si) by avoiding epitaxy in silicon heterojunction (SHJ) solar cell technology has recently been proposed and successfully applied. Herein, the microstructure of such underdense a‐Si:H films, as used in our silicon heterojunction solar cell baseline, is investigated mainly by Raman spectroscopy, effusion, and secondary ion mass spectrometry. In H effusion experiments, a low‐temperature (near 400 °C) effusion peak which has been attributed to the diffusion of molecular H2 through a void network is seen. The dependence of the H effusion peaks on film thickness is similar as observed previously for void rich, low substrate‐temperature a‐Si:H material. Solar cells using underdense a‐Si:H as i1‐layer with a maximum efficiency of 24.1% are produced. The passivation quality of the solar cells saturates with increasing i1‐layer thickness. The fact that with such underdense material combined with a following high‐quality i2‐layer, instead of only high‐quality a‐Si:H with a low defect density direct on the c‐Si substrate, good passivation of c‐Si solar cells is achieved, which demonstrates that in the passivation process, molecular hydrogen plays an important role.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.